产品简介
Sub-nanometer imaging and automated TEM sample preparation with Helios 5 DualBeam for high-quality 2D/3D characterization in materials and semiconductor research.
支持按工艺目标、样本类型与通量要求进行选型建议。
## 官方资料摘要
品牌方页面标题：FIB-SEM | Helios 5 DualBeam | Thermo Fisher Scientific - CN
Sub-nanometer imaging and automated TEM sample preparation with Helios 5 DualBeam for high-quality 2D/3D characterization in materials and semiconductor research.
## 官方信息要点
- It supports sub-nanometer SEM and STEM imaging alongside ultra-thin, site-specific TEM lamella preparation.
- x Helios 5 DualBeam features Reveal very fine details Sub-nm SEM and STEM imaging for remarkable analyses at the nanoscale.
## 来源
- 官方页面：https://www.thermofisher.cn/cn/zh/home/electron-microscopy/products/dualbeam-fib-sem-microscopes/helios-5-dualbeam.html
- 采集时间：2026-07-26T08:58:53.678Z